{
  "value": "yield_analysis_summary",
  "label": "Summarize Yield Analysis Results",
  "description": "This workflow transforms complex yield data into actionable summaries for management and customers. Input wafer maps, bin data, and parametric results, and the AI will identify trends, root causes, and improvement opportunities in clear business terms.",
  "name": "Yield Summary",
  "category": "Semiconductors",
  "type": "Industry",
  "config": {
    "temperature": 10,
    "frequencyPenalty": 0,
    "disableRAG": true,
    "prompt": [
      {
        "role": "user",
        "content": "Create a yield analysis summary from the semiconductor production data. Start with overall yield trends and comparison to targets. Identify primary yield detractors by failure bin and parametric limits. Analyze spatial patterns suggesting systematic issues. Correlate yield with process parameters or equipment sets. Highlight any lots or wafers requiring special attention. Calculate yield impact in terms of die loss and revenue. Recommend specific actions for yield improvement with expected recovery. Include statistical confidence levels for conclusions. Present data visually with charts where helpful. End with prioritized action items."
      }
    ]
  }
}