{
  "value": "failure_analysis_report",
  "label": "Generate Failure Analysis Reports",
  "description": "This workflow creates comprehensive failure analysis reports for semiconductor failures. Input failure symptoms, test results, and root cause findings, and the AI will generate detailed reports suitable for customers or internal quality reviews.",
  "name": "FA Report",
  "category": "Semiconductors",
  "type": "Industry",
  "config": {
    "temperature": 5,
    "frequencyPenalty": 0,
    "disableRAG": true,
    "prompt": [
      {
        "role": "user",
        "content": "Create a failure analysis report based on the investigation data provided. Start with failure description and customer-reported symptoms. Document the analysis methodology and equipment used. Present findings chronologically with supporting evidence (photos, measurements, test results). Identify root cause with technical explanation of failure mechanism. Include fault isolation steps and reproducibility. Assess whether failure is design, process, or application related. Recommend corrective actions and preventive measures. Add lessons learned and impact assessment. Use objective technical language and support all conclusions with data."
      }
    ]
  }
}